CHEN, Yaoyin. Validation-Guided Lightweight Attention for Small Chip Surface Defect Detection. Journal of Computing and Electronic Information Management, [S. l.], v. 22, n. 2, p. 38–41, 2026. DOI: 10.54097/nj5jrr19. Disponível em: https://jceim.org/index.php/ojs/article/view/239. Acesso em: 28 aug. 2026.